High Resolution Scanning electron microscope(S9000 LMH，Tescan， equipped with Energy Dispersive Spectroscopy) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Features:

Secondary electron resolution: 0.7nm(15kV), 1.0nm(1kV), 1.2nm(200V)

Backscattered electron resolution: 1.6nm(15kV)

Electron beam current range: 2pA – 400nA

Accelerating voltage: 50V – 30kV

SEM imaging of non-conductive Samples: Beam Deceleration Mode