Atomic Force Microscope（AFM, Dimension ICON）is an analytical instrument used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of materials by detecting extremely weak atomic interactions between the surface of the test sample and a micro force sensitive element.

Main characteristics:

Scanning range in the XY direction: ≥90 μm

Scanning range in the Z direction: ≥10 μm

XY direction closed-loop noise level: RMS≤0.15 nm

Z-direction closed-loop noise level: RMS≤35 pm

Kelvin probe microscope with peak force